Genesis® Enterprise offers a complete yield management enterprise platform that combines parametric, defect and yield optimization with data mining and workflow development across all data sources from memory and design to assembly and packaging.
With its patented Yield Mine® automated decision making technology, Genesis reduces the time it takes to find root causes of yield excursions. With its comprehensive, production-established YieldBase® and Metadata™ package, Genesis enables its customers to broaden their analysis scope for better yield.
The software also includes data acquisition and integration, a development environment through workflow and scripting, and specialized analysis algorithms to identify domain-specific issues, such as data mining, spatial anomalies, wafer processing sequence problems, commonality of effects, system and random yield loss.
In addition, Genesis provides two distinct tools – Principal Components and multivariate analysis of variance (MANOVA) – that allow systematic, simultaneous examination of multiple variables. These tools are combined with the data mining technology to provide a powerful tool set for yield analysis.
Genesis Enterprise is designed for:
- Fast production ramp up and continuous yield improvement
- High performance data mining with patented Yield Mine automated decision making technology
- Integrating data from any existing database with the reliable YieldBase and Metadata data management and connectivity infrastructure
- A comprehensive genealogy module