Discover® is an inline defect analysis and data management system designed to seamlessly handle advanced macro frontside, edge and backside inspection results.
With built-in wafer level ADC, Discover enables quick identification of damaging killer defects that can ruin the entire wafer. Device failure can now be correlated to backside and edge defects in a single intuitive screen. Designed with process excursion detection ability, Discover can automatically issue alarms and trigger user-defined macros that reproduce skilled decision-making steps. Creating, deploying and managing all-surface wafer inspection sampling plans have never been easier. Discover is the perfect solution for your all-surface analysis needs.
Discover is designed with:
- Customizable reports
- Built in spatial pattern recognition
- Advanced sampling to improve the performance of your ADC system
- Ability to pass or fail wafers based on customizable logic
- Automated alarms
- In depth analysis tools to satisfy even the most detailed engineers