Discover Review

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Discover Review

Rudolph Technologies offers a complete off-line all-surface review, Discover® Review Software.

Discover Review is a fast classification solution that rapidly guides users through the sequences of defect classification and correlation.

Discover Review is designed to:

  • Maximize tool inspection throughput while Discover Review performs off line
  • Allow operators to correlate and visualize defects individually or collectively using an interactive, all-surface wafer map
  • View correlated defects based on location - wafer edge, frontside, and backside
  • Select individual or multiple images in the Gallery Mode for fast classification and defect comparison
  • Export a wafer map in any format supported by our "plug-n-play" wafer maps
  • Enhance the value of your all-surface inspection equipment by increasing total inspection and classification throughput