January 18, 2007
Rudolph Reaches Milestone with 50th AXi System Installation at Korean Memory Manufacturer
January 22, 2007
Rudolph Appoints Yasuomi Uchida, Chairman, and Yoshiro Ogaya, President, of Rudolph Technologies Japan KK
February 7, 2007
Rudolph Technologies Announces Record 2006 Quarterly Earnings In Line With Guidance
February 22, 2007
Rudolph Continues Leadership in Automotive IC Inspection with Order from austriamicrosystems
European analog integrated circuits provider places order for both front- and back-end inspection solutions.
April 4, 2007
Rudolph Technologies Schedules First Quarter 2007 Earnings Conference Call for May 7, 2007
May 7, 2007
Rudolph Technologies Announces First Quarter 2007 Revenue and Earnings In Line With Guidance
June 14, 2007
Rudolph Receives Multiple System Order for NSX 105 Automated Macro Defect Inspection Tool
July 16, 2007
Rudolph Technologies Announces New Discover Data Analysis Software
New software enhances return on inspection and metrology investments and speeds time-to-yield learning
July 16, 2007
Rudolph’s New Explorer Family Brings Cluster Architecture to Multi-surface Inspection Tools
Adaptive wafer scheduling, flexible configuration and high throughput reduce cost-of-ownership
July 16, 2007
Rudolph’s New MetaPULSE IIIa System Offers Higher Throughput and Lower CoO for DRAM Metrology Applications
Multiple Orders Already Received from Taiwanese DRAM Fabs
July 23, 2007
Rudolph Technologies Schedules Second Quarter 2007 Earnings Conference Call for August 6, 2007
August 6, 2007
Rudolph Technologies Announces Second Quarter 2007 Revenue and Earnings in Line With Guidance
August 14, 2007
European Fab Installs Second Rudolph Inspection System to Meet 100-Percent Inspection Requirements of Automotive Industry
Fast, automated NSX tools become de facto standard
September 4, 2007
Rudolph Technologies Delivers Edge Inspection Tool to ASML Holding NV
Equipment will focus on the impact of wafer edge process control
September 10, 2007
Rudolph Showcases AXi 935 Advanced Macro Defect Inspection System at SEMICON Taiwan 2007
Taiwan foundry selects Rudolph AXi for Copper CMP
September 17, 2007
Rudolph’s DMSVision Software Improves Yield in Advanced 300mm Memory Fabs
Fab-wide Data Management System—a Platform for Higher Yields
October 1, 2007
Japan Fab Purchases Rudolph AXi System for Inspection of Automotive Devices
Macro inspection edges into space previously occupied by high-cost micro tools
October 2, 2007
Rudolph Technologies Schedules Third Quarter 2007 Earnings Conference Call for November 1, 2007
October 15, 2007
Rudolph Technologies Announces Milestone Shipments of TrueADC Software for Automatic Defect Classification
Installed base exceeds 30 systems; 18 shipped in most recent quarter
November 1, 2007
Rudolph Technologies Announces Third Quarter 2007 Earnings Above Guidance and Revenue at Top End of Guidance Range
November 7, 2007
Rudolph To Ship Multiple Transparent Film Metrology Tools to Taiwan Memory Foundry
New, production-worthy S3000A System moves quickly into marketplace
November 14, 2007
Rudolph Ships 100th Wafer Edge and Backside Inspection System
An increasing number of fabs recognize value of all-surface inspection
November 27, 2007
Rudolph Technologies and Entrepix, Inc. Announce License Agreement
Entrepix to market Rudolph AutoEL Series Ellipsometer
December 18, 2007
Rudolph Technologies Acquires Semiconductor Business of Applied Precision, LLC
Wafer probe card test and analysis added to Rudolph’s portfolio
